DIC microscope, also known as Nomarski contrast microscope, has the advantage of being able to display three-dimensional projection images of structures. Compared with phase contrast microscopy, the specimen can be slightly thicker and the refractive index difference is larger, so the image has a stronger three-dimensional effect. DIC microscopes use plane polarized light as the light source. After being refracted by the prism, the light is divided into two beams, passing through adjacent parts of the sample at different times, and then passing through another prism to merge the two beams of light, thereby converting the small difference in thickness of the sample into a difference in light and dark.



一. Brief description of optical system

The non-polarized light passes through the 45° polarizing plate, then through the prism, and is divided into two beams of polarized light that are perpendicular to each other. After passing through the condenser lens, the light reaches the sample & stage. After the action of the sample, the light undergoes a phase shift, and then passes through The objective condenser lens converges to the prism again, and the prism recombines the two mutually perpendicular polarized lights into the same polarization direction (the phase difference is converted into amplitude), that is, the 135° polarization direction, which causes light interference, causing The image is enhanced or darkened, depending on the optical path difference, and then passes through a 135° polarizer to remove the directly transmitted light.

二. Features

1. The preparation requirements for metallographic samples are reduced. For some samples, it can even be observed by polishing without corrosion treatment. The advantage is that the true state of the sample surface can be observed, such as polishing the sample under vacuum. Martensite phase transformation, the embossment of martensite phase transformation can be observed without corrosion.

2. The observed surface has obvious concavity and relief, and the relative hierarchical relationship between the various components of the sample can be displayed. Correct judgments can be made on particles, cracks, holes and protrusions, etc., which improves the quality of metallurgy. It improves the accuracy of phase inspection and also increases the contrast between phases.

3. Use Nomarski contrast microscope to observe the sample, and you will see many details that cannot be seen in bright field. Some structural details or defects that are difficult to distinguish in bright field can be easily judged by contrast enhancement through differential interference.

三. Model selection


HXJ-4R/HXJ-4RT

HXJ-6R/HXJ-6RT

Product description:
 
EOC's newly launched DIC microscope is a very special analysis and inspection method. The relative hierarchical relationship of the observed samples is outstanding and appears in an obvious relief shape. It can make correct judgments on particles, cracks, holes and bulges, etc. , can determine many structural details or defects that cannot be seen or are difficult to distinguish under bright field, which are conductive particle indentation, particle blasting inspection, wafer grinding surface, magnetic head grinding surface and hard disk surface detection in the LCD screen industry An ideal tool for other industries.




Features:
 
1. HXJ-4R/HXJ-6R can achieve a movement range of 105 mHXJ-105 Mn/158 mHXJ-158 mm in X and Y directions.
 
2. The newly designed long working distance professional metallographic objective lens has better imaging effects.
 
3. Clear, sharp and high-contrast microscopic images can be obtained under various observation methods.
 
4. Complete accessories and perfect configuration, allowing for flexible system combination and function expansion.
 
5. Ergonomic design, solid and reliable system structure.




Product observation method:
 
DIC observations:


On the basis of cross-polarized light, DIC differential interference observation can be performed by inserting a prism. Using DIC technology, the slight height difference on the sample surface can produce an obvious relief effect, greatly improving the contrast of the image. It can be matched with DIC function The objective lens makes the interference color consistent across the entire field of view, the differential interference effect is excellent, and the DIC effect of the high-magnification objective lens is also good.


Conductive particles 20X DIC




LED epitaxy detection 20X DIC


 

Wafer 50X DIC

 

Bright field observation (reflection):

The telecentric Kolar reflection illumination system, coupled with the newly designed infinity long working distance plan achromatic metallographic objective lens, can obtain clear, flat and bright high-quality microscopic images from low to high magnification.

IC 5X Brightfield

Pull the dark field lighting lever to the designated position to use the dark field function, which allows you to observe various scratches, impurities and other minor defects on the surface of the object. The built-in attenuator reduces the irritation to the eyes caused by the dramatic changes in light when switching between light and dark fields. .The dark field function is limited to HXJ-6R/HXJ-6RT models.

FPC 10X Darkfield

Simple polarized observation:

Insert the polarizer and analyzer insert plate into the designated position of the illuminator to perform simple polarization observation. The analyzer can be divided into fixed type and 360° rotating type.

 

Pcb cross section 20X simple polarization
 

Differential interference microscope can not only observe colorless and transparent objects, but also the image presents a relief-like three-dimensional effect, and has certain advantages that phase contrast microscopy cannot achieve, and the observation effect is more realistic.